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Equipment topics
3D Microstructure Analysis System
- Installation :
- September 2013
- Description :
- Hitachi High-Technologies NB5000 (FIB/FE-SEM) equipped with TSL EBSD analysis system. Cross-sectional FE-SEM/EBSD images can be obtained, leading to 3D-SEM/EBSD images can be created using the attached software (Our support is essential).
- Contact :
